|A calibration source for the Mu2e crystal calorimeter (December 21, 2017)||Caltech performs joint BABAR/Belle analysis to resolve CKM Unitarity Triangle ambiguity (December 21, 2017)||Caltech HEP LHC team presents results at NIPS 2017 in Long Beach (December 8, 2017)|
|Caltech and AT&T present Quantum Networks R&D program at SuperComputing17 in Denver (November 14, 2017)||Solving a Higgs Optimization Problem with Quantum Annealing for Machine Learning (October 18, 2017)||Fast Data Transfer Tutorial at the Internet2 2017 Technology (October 15, 2017)|
|2017 Physics Nobel Laureate, Barry Barish and the High Energy Physics faculty at Caltech on October 9 2017 at Caltech’s Athenaeum (October 9, 2017)||Fast and Radiation Hard Inorganic Scintillators under Development in the HEP Crystal Laboratory (September 25, 2017)||Golwala's group new results on supersensitive millimeter and submillimeter sensors for cosmic microwave background and other astronomical sources measurements (September 2017)|
Device to test intrinsic quality of the very thin (2-5 microns) crystalline silicon dielectric. The six long rectangles are superconducting niobium LC resonators that incorporate the silicon in a parallel-plate capacitor. The long meandering line is the RF feedline use to pump and probe the resonators. The loss is given by the reciprocal of the resonance quality factor (after accounting for loss of power back to the feedline). The other six devices are niobium coplanar waveguide resonators used to measure the quality of the niobium itself.